Presenter:  Zeeshan Ahmed, NIST, Sensor Science Division, Thermodynamic Metrology Group

(1 day) Wednesday, April 17, 2019


We will present a brief introduction to photonics technology including fiber optics, silicon nano-photonics and opto-mechanics and their relevance to sensing applications. A particular focus will be understanding the opportunities photonics present in metrology and avoiding pitfalls that can limit their usefulness