NIST Seminars

 NIST Seminar

 

Presenter

 

Date

 

Understanding ISO/IEC 17025:2017 

 

Dana Leaman

 

April 16, Tuesday (1 Day)

 

Auditing, Traceability, and Auditing of Traceability: auditing to ISO/IEC 17025:2017

Kari Harper and Titilayo Shodiya

April 17, Wednesday (1 Day)

 

JCGM Guide to the Expression of Uncertainty in Measurement

 

William Guthrie and Hung-Kung Liu

 

April 16-18, Tues-Thurs (3 Day)

 

Traceability, Operations, and Good Measurement Practices for Balances in an Analytical Environment

 

Mark Ruefenacht, NIST OWM

 

April 17, Wednesday (1 Day)

 

Microwave Measurement Fundamentals

 

Ron Ginley, NIST, RF Electronics Group, RF Technology Division

April 16, Tuesday (1 Day)

 

NIST Pressure and Vacuum Measurement

 

Jacob Ricker and Christopher Meyer, NIST Thermodynamic Metrology Group

 

April 16-17, Tues-Wed (2 Day)

 

Introduction to Photonics

 

Zeeshan Ahmed, NIST, Sensor Science Division, Thermodynamic Metrology Group

 

April 17, Wednesday (1 Day)

 

Optical Gas Pressure Measurement via Fixed Length Optical Cavity (FLOC) Pressure Standards 

 

Jacob Ricker

April 18, Thursday (1 Day)

 

Realization and Dissemination of Mass in the “New SI”

 

Patrick Abbott

 

April 16, Tuesday (1 Day)

 

 

 

 

 

 

 

 

 

 

 


For any questions contact

MSC Committee

1-866-672-6327 1-866-672-6327

measurementscienceconference@gmail.com