Click on Seminar numbers below or title to get information on each Seminars. Learn more about presenter by clicking on their names.

APRIL 16, 2019 – TUESDAY

WORKSHOP TITLE PRESENTER DURATION
N01 JCGM Guide to the Expression of Uncertainty in Measurement William Guthrie and Hung-Kung Liu April 16-18, Tues-Thurs (3 Day)
N02 NIST Pressure and Vacuum Measurement Jacob Ricker and Christopher Meyer, NIST Thermodynamic Metrology Group April 16-17, Tues-Wed (2 Day)
N03 Understanding ISO/IEC 17025:2017 Dana Leaman April 16, Tuesday (1 Day)
N04 Microwave Measurement Fundamentals Ron Ginley, NIST RF Electronics Group, RF Technology Division April 16, Tuesday (1 Day)
N05 Realization and Dissemination of Mass in the “New SI” Patrick Abbott April 16, Tuesday (1 Day)

 

APRIL 17, 2019 – WEDNESDAY

WORKSHOP TITLE PRESENTER DURATION
N06 Auditing, Traceability, and Auditing of Traceability: auditing to ISO/IEC 17025:2017 Kari Harper and Titilayo Shodiya NVLAP April 17, Wednesday (1 Day)
N07 Traceability, Operations, and Good Measurement Practices for Balances in an Analytical Environment Mark Ruefenacht, NIST OWM, Rice Lake Weighing Systems April 17, Wednesday (1 Day) Canceled
N08 Introduction to Photonics Zeeshan Ahmed,NIST, Sensor Science Division, Thermodynamic Metrology Group April 17, Wednesday (1 Day)
N10 Fundamentals of Metrology Georgia Harris and Carol Hockert April 17-18, Wed – Thurs (2 Day)

 

APRIL 18, 2019 – THURSDAY

WORKSHOP TITLE PRESENTER DURATION
N09 Optical Gas Pressure Measurement via Fixed Length Optical Cavity (FLOC) Pressure Standards Jacob Ricker, NIST Thermodynamic Metrology Group April 18, Thursday (1 Day)
N10 Fundamentals of Metrology Georgia Harris and Carol Hockert April 17-18, Wed – Thurs (2 Day)

For any questions contact MSC Committee 1-866-672-6327 measurementscienceconference@gmail.com