NIST Seminars

Click on Seminar numbers below or title to get information on each Seminars. Learn more about presenter by clicking on their names.
APRIL 16, 2019 – TUESDAY

SEMINAR TITLE PRESENTER DURATION

N01

 

 

JCGM Guide to the Expression of Uncertainty in Measurement

 

William Guthrie and Hung-Kung Liu

 

April 16-18, Tues-Thurs (3 Day)

 

N02

 

NIST Pressure and Vacuum Measurement

 

Jacob Ricker and Christopher Meyer, NIST Thermodynamic Metrology Group

 

April 16-17, Tues-Wed (2 Day)

 

 

N03

 

 

Understanding ISO/IEC 17025:2017

 

 

Dana Leaman

 

 

April 16, Tuesday (1 Day)

 

NO4  

Microwave Measurement Fundamentals

 

Ron Ginley, NIST, RF Electronics Group, RF Technology Division

 

April 16, Tuesday (1 Day)

 

N05  

Realization and Dissemination of Mass in the “New SI”

 

Patrick Abbott

 

April 16, Tuesday (1 Day)

 

APRIL 17, 2019 – WEDNESDAY

SEMINAR TITLE PRESENTER DURATION
N06

 

 

Auditing, Traceability, and Auditing of Traceability: auditing to ISO/IEC 17025:2017

 

 

Kari Harper and Titilayo Shodiya

NVLAP

 

April 17, Wednesday (1 Day)

 

N07

 

 

Traceability, Operations, and Good Measurement Practices for Balances in an Analytical Environment

 

 

Mark Ruefenacht, NIST OWM, Rice Lake Weighing Systems

 

April 17, Wednesday (1 Day)

 

N08

 

 

 

Introduction to Photonics

 

 

 

Zeeshan Ahmed, NIST, Sensor Science Division, Thermodynamic Metrology Group

 

 

April 17, Wednesday (1 Day)

 

 

 

 

 

 

 

APRIL 19, 2019 – THURSDAY

SEMINAR TITLE PRESENTER DURATION
 

N09

 

 

Optical Gas Pressure Measurement via Fixed Length Optical Cavity (FLOC) Pressure Standards

 

Jacob Ricker,  NIST Thermodynamic Metrology Group

 

 

April 18, Thursday (1 Day)

 

For any questions contact MSC Committee 1-866-672-6327 1-866-672-6327 measurementscienceconference@gmail.com