NIST Seminars

 NIST Seminar






Understanding ISO/IEC 17025:2017 


Dana Leaman


April 16, Tuesday (1 Day)


Auditing, Traceability, and Auditing of Traceability: auditing to ISO/IEC 17025:2017

Kari Harper and Titilayo Shodiya

April 17, Wednesday (1 Day)


JCGM Guide to the Expression of Uncertainty in Measurement


William Guthrie and Hung-Kung Liu


April 16-18, Tues-Thurs (3 Day)


Traceability, Operations, and Good Measurement Practices for Balances in an Analytical Environment


Mark Ruefenacht, NIST OWM


April 17, Wednesday (1 Day)


Microwave Measurement Fundamentals


Ron Ginley, NIST, RF Electronics Group, RF Technology Division

April 16, Tuesday (1 Day)


NIST Pressure and Vacuum Measurement


Jacob Ricker and Christopher Meyer, NIST Thermodynamic Metrology Group


April 16-17, Tues-Wed (2 Day)


Introduction to Photonics


Zeeshan Ahmed, NIST, Sensor Science Division, Thermodynamic Metrology Group


April 17, Wednesday (1 Day)


Optical Gas Pressure Measurement via Fixed Length Optical Cavity (FLOC) Pressure Standards 


Jacob Ricker

April 18, Thursday (1 Day)


Realization and Dissemination of Mass in the “New SI”


Patrick Abbott


April 16, Tuesday (1 Day)












For any questions contact

MSC Committee

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