Defining the traceability path for the Short-Open-Load (SOLx) family of Vector Network Analyzer (VNA) calibrations has always been a problem. We have developed a process that clears up the issues by replacing the empirical models of the calibration standards with data defined models. The data models are determined using our most accurate VNA calibration technique that is traceable back to dimensional standards.
To facilitate this process, we use the new NIST Microwave Uncertainty Framework (MUF). The development of the process and descriptions of the relevant steps will be covered as well as results showing the effectiveness of the process.