2018 MSC Technical Sessions

MSC, annually attracts outstanding Technical Program speakers in the Measurement Science profession in Emerging Technologies, Core Calibration Measurements, BioScience, Pharmaceutical, & Health Care, Quality & Process Management, in a broad range of industries. These 75-minute sessions  (listed below ) are meant to present real applications, real results, and real solutions approaches based on metrology and quality principles, or theory that can be implemented immediately upon returning to the workplace. These presentations provide a high degree of value to people that attend MSC Symposium.


MSC’s  2018 Technical Sessions

Day 1 – Thursday, March 22

 7:00 am – 5:00 pm          Registration
 7:30 am – 8:45 am          Continental Breakfast & Exhibit Viewing
 7:30 am – 5:00 pm          Exhibit Hall Hours
 Track A Track B Track C Track D
Emerging Technologies Laboratory & Calibration NIST Technical Briefs Quality & Process Management

Session 1

8:45 am – 10:00 am

Internet of Things and Cloud Applications.  A Survival Guide of Facilities Managers
Speaker: Chris Exline
Klatu Networks
Traceability of Low Conductivity Measurements

Speaker: David Zabarsky
Martek Instruments

Redefinition of the Pascal through NIST’s Variable Length Optical Cavity and the Quantum SI

Jacob Ricker
Overview of Low Pessure Metrology at NIST

Speaker: Julia Scherschligt

Data Integrity in an FDA Regulated Environment

Speaker: Bill Honeck


 10:00 am – 10:45 am Morning Break – Exhibit Viewing

Session 2

10:45 am – 12:00 pm

Using Predictive Maintenance (PdM) to Lower Maintenance Costs

Speaker: Larry Newman
Thermo Fisher Scientific

Speaker: Frank Valez
Carl Zeiss Industrial Metrology, LLC
Creating a Traceability Chain for Short-Open-Load VNA Calibration Kits Using the NIST Microwave Uncertainty Framework

Speaker: Ron Ginley

Metrology After Mercury

Speaker: Dawn Cross

What will be the Metrology paradigm in 2050?

Speaker: Chet Franklin

Franklin Training Systems

12:15 am – 1:30 pm Luncheon and Keynote Speaker
Session 3

1:45 pm – 3:00 pm

A Proposal for a Standard Calibration Data Format

Speaker: Michael Johnston
Fluke Mfg. Co.

True Value and Uncertainty in Measurement

Speaker: Raghu N. Kacker

Data Integrity for Metrology

Speaker: Georgia Harris


The Power of Mise-En-Place in the Metrology and Testing Laboratory

Speaker: Mark Ruefenacht

How to conduct at Measurement System Performance Study (i.e. Gage R&R, Control Charting, MSA SWIPE Cause & Effect Diagram)

Speaker: Mark Lindsey
Disneyland Resort Quality Assurance

3:00 pm – 3:45 pm Afternoon Break – Exhibit Viewing

Session 4

3:45 pm – 5:00 pm

Innovations in Precision Voltage Dividers

Speaker: Tim Stark
Guildline Instruments

Humidity Basics: What is relative humidity, and how has it been measured over time?

Speaker: Paul Daniel

Physical and Chemical Sensing with Photonics
Speaker: Dr. Zeeshan Ahmed
Integrating the Shingo Model with ISO 9001:2015 Standard to Achieve Operational Performance Excellence
Speaker: Vern Goodwalt
The 3 Point Group
7:00 pm -9:00 pm

  MSC Presidents Reception:

Kenny Metcalf as Elton John,  The Early Years Tribute



MSC’s  2018 Technical Sessions

Day 2 – Friday, March 23

 7:00 am – 5:00 pm          Registration
 7:30 am – 8:45 am          Continental Breakfast & Exhibit Viewing
 7:30 am – 5:00 pm          Exhibit Hall Hours
 Track A Track B Track C Track D
Emerging Technologies Core Calibration Measurements BioScience,
Pharmaceutical & Healthcare
Student Presentations

Session 5

8:45 am – 10:00 am

Sustainable Asset Management (ISO 55000)

Speaker: Ryan Andrews

Strategic Monitoring Sensor Placement
Speaker: John Masiello
Masy Bioservices
Measurement Information Infrastructure (MII):
Letting Metrology Systems Talk to Each Other
Speakers:Mark Kuster, Pantex Metrology; Colin Walker, Qualer;
Mike Schwartz, Cal Lab Solutions
Student Presentations
Fairmont Preparatory Academy Advanced Science Engineering Program
 10:00 am – 10:45 am Morning Break – Exhibit Viewing

Session 6

10:45 am – 12:00 pm


The Impact of the Revised ISO/IEC 17025:2017 Standard, Panel Discussion

Moderator: Emil Hazarian. CSUDH,

Panelists: (Lead) Jeff Gust, Fluke;

Dr. George Anastasopoulos, IAS;

Charles Ellis, NAPT;

Dana Leaman, NVLAP;

Randy Long, ANAB;

Gerhard Mihm, German Armed Forces;

Asynchronous 3-Phase Power Measurement

Speaker: Richard Timmons
Guildline Instruments

Low Conductivity Measurements and Real Time Release Testing

Speaker: Jun Bautista
Crosspoint Engineering

Applications of Predictive Maintenance

Speaker:  Hans Devouassoux,

Disneyland Resort Predictive Maintanance

12:15 am – 1:30 pm Luncheon and Keynote Speaker
12:15 pm -3:15 pm Please turn in Evaluations at Registration Desk

1:45 pm – 3:30 pm

 Plenary Session – Magic Kingdom Ballroom

“The Next Step In Measurement Innovation”

Moderator Chet Franklin, Franklin Training Systems