N10: NIST ON A CHIP: FIELD DEPLOYABLE MEASUREMENT TECHNOLOGY FOR INCREASED DoD OPERATIONAL READINESS
HALF-DAY COURSE | AM:
Wednesday, March 27th: 8:00am – 10:00am
Leaders: Jay Hendricks and Barbara Goldstein, NIST
Panel Members: Jeremy Latsko, AFMETCAL, Michael Todd, APSL, and Ed Trovato, Naval Surface Warfare Center
Abstract:
Technology has changed over the years. It has gotten smaller, more affordable, more mobile. These advances demand a new era of measurement science. The NIST on a Chip (NOAC) program has the vision that devices of the future will combine the latest advances in metrology with the latest advances in technology. These devices will make the most precise measurements in the world smaller, affordable, most importantly, based on quantum standards that NIST has pioneered. This will enable fit-for-purpose calibration-free metrology to go anywhere, at any time. The Department of Defense (DoD) is partnering with NIST to be part of this metrology revolution. To move to action, the DoD established the Advanced Technology Working Group to deepen NIST/DoD collaborations, with the aim to transition these cutting-edge NOAC technologies into the Services, and to deploy NOAC solutions as far into the field as possible to advance mission readiness and agility. This panel brings together DoD metrology leaders and NIST technical experts to discuss how NOAC technologies usher in a new paradigm for measurement dissemination.