Our NIST on a CHIP Panel Session is on Thursday, March 26 after the Exhibit Hall.
You can find more information on the Panel Session below.
NIST on a CHIP: Launching a Quantum Metrology Revolution
Thursday, March 26, 2020 (After Exhibit Hall)
Abstract: I NIST has embarked on a sweeping program that will revolutionize measurement services and metrology by bringing them out of the lab and directly to the user through a suite of intrinsically accurate, quantum-based measurement devices. In this panel, NIST staff will highlight some of the innovative technologies enabling this new paradigm, and users will discuss how NIST on a Chip technology benefit their operations.
Julia Scherschligt, NIST
Chris Holloway, NIST
Roger Peniche, Sr. Director, Fluke Calibration
Bob Fritzsche, Navy
Julia Scherschligt is group leader of the Thermodynamic Metrology group within the Physical Measurement Laboratory at NIST. Her academic background is in semiconductor physics and she has extensive experience in low-temperature physics and vacuum and pressure technology development. She is involved with several NIST-On-A-Chip activities and is committed to helping bridge the gap between basic research in a laboratory setting, and commercial technology that can be deployed by an end-user.
Christopher L. Holloway
National Institute of Standards and Technology
Christopher L. Holloway received the B.S. degree from the University of Tennessee at Chattanooga in 1986, and the M.S. and Ph.D. degrees from the University of Colorado at Boulder in 1988 and 1992 respectively, both in electrical engineering.
During 1992 he was a Research Scientist with Electro Magnetic Applications, Inc., in Lakewood, Co. His responsibilities included theoretical analysis and finite-difference time-domain modeling of various electromagnetic problems. From the fall of 1992 to 1994 he was with the National Center for Atmospheric Research (NCAR) in Boulder, Co. While at NCAR his duties included wave propagation modeling, signal processing studies, and radar systems design. From 1994 to 2000 he was with the Institute for Telecommunication Sciences (ITS) at the U.S. Department of Commerce in Boulder, Co., where he was involved in wave propagation studies. Since 2000 he has been with the National Institute of Standards and Technology (NIST), Boulder, CO, where he works on electromagnetic theory. He is also on the Graduate Faculty at the University of Colorado at Boulder.
Dr. Holloway was awarded the 1999 Department of Commerce Silver Medal for his work in electromagnetic theory and the 1998 Department of Commerce Bronze Medal for his work on printed circuit boards. His research interests include electromagnetic field theory, wave propagation, guided wave structures, remote sensing, numerical methods, and EMC/EMI issues. Dr. Holloway is a member of Commission A of the International Union of Radio Science and is an Associate Editor for the IEEE Transactions on Electromagnetic Compatibility. Dr. Holloway is the chairman for the Technical Committee on Computational Electromagnetic (TC-9) of the IEEE Electromagnetic Compatibility Society.
Robert (Bob) E. Fritzsche
METCAL Chief Engineer
Measurement Science Department
Naval Surface Warfare Center, Corona Division
Bob Fritzche is the Chief Engineer for the Measurement Science Department, Naval Surface Warfare Center, Corona Division. He has spent over 30 years as a metrology professional within the same organization. NSWC Corona is a US Navy installation located in Norco, California and has been the Navy’s Metrology Engineering Center since 1958.
His initial assignment was the development of calibration procedures for physical/mechanical test equipment. Over the next three decades, he worked as the team lead for calibration procedure development was the project manager for Kuwait Foreign Military Sales Metrology and Calibration (METCAL) support, managed the Sea Systems Metrology Branch, successively served as the Head of the Metrology Engineering and METCAL In-Service Divisions, and in late 2014 became the Chief Engineer.
During his career with the Navy, Bob served as the President of the Measurement Science Conference in 2007 and the MSC Chairman in 2008. He chaired the NCSLI 174 Standards Writing Committee from 2007 to 2012 and served on the NCSLI Board of Directors from 2011 to 2013. Bob also participated on NACLA Board of Directors for more than a decade and is the Navy’s representative on the Joint Service Calibration Coordination Group.
Bob received a bachelor’s degree in Mechanical Engineering from California State University, Fullerton in 1989. He currently lives in Murrieta, California with his wife, April, who is also a metrology professional, and their children Alex and Kassandra.
Senior Director, Engineering
Roger Peniche, Senior Director, Engineering for Fluke Calibration (part of Fluke Corporation). Roger has held directorships and VP positions in engineering for several divisions of Fortive. Before that he spent 10 years in General Electric and a couple of years in the process construction industry in Mexico. He holds a dual degree in Mechanical and Electrical Engineering and a Masters in Computational Fluid Dynamics from Imperial College, London UK. Fluke currently partners with NIST in a number of projects/initiatives around quantum metrology.