NIST ON A CHIP: ACCELERATING TECHNOLOGY THROUGH AGILE METROLOGY
HALF-DAY COURSE | AM:
Wednesday, March 27th
Presenters: Jay Hendricks, Barbara Goldstein, NIST
Abstract:
NIST on a Chip: accelerating technology through agile metrology
Conference: March 25-28, 2024
Disneyland Hotel Convention Center
Panel: March 27, 2024 (start of day)
Jay Hendricks, Barbara Goldstein, NIST
NIST is leading the forward-looking NIST on a Chip (NOAC) program to deliver precision measurements directly to point-of-use through a suite of intrinsically accurate, quantum-based sensors and standards. The DoD established the Advanced Technology Working Group to deepen NIST/DoD collaborations, to transition these cutting-edge NOAC technologies into the Services, and to deploy NOAC solutions as far into the field as possible to advance mission readiness and agility. This panel brings together DoD metrology leaders and NIST technical experts to discuss how NOAC technologies usher in a new paradigm for measurement dissemination.
10 – NOAC overview
15 – Jeremy Latsko, AF
15 – Bob Fritzsche, Navy
15 – Mike Todd, Army
15 – Mass & Torque, Leon Chao
20 – Panel discussion