Our Plenary Sessions Occur After Lunch on Friday, March 27.

You can find more information on the Plenary Sessions below.

Full Course Planner - MSC


Title: From Ohm to Quantum Ohm

Friday, March 27, 2020 (After Lunch)

Abstract: From the time of the founding of the National Bureau of Standards (NBS) in 1901 to the present, resistance measurements have been among the research activities to realize electrical units at the National Institute of Standards and Technology (NIST). The U. S. representation of the ohm has seen many changes over the past 120 years including three adjustments (1948, 1990, 2019), advances in standards and instrumentation, the discovery of the quantum Hall effect, and realization of the ohm by fundamental constants. The standards and instrumentation have leveraged advances in technology and evolved to support the many needs for resistance measurements over wider ranges with reduced uncertainties.

From the mercury ohm of the early days to the development of ultra-stable wire wound resistance standards, to the quantum graphene standards of today and tomorrow: resistance metrology has been a part of the research activities at NIST and the other national metrology institutes (NMIs) for over a century. Looking towards the future, resistance measurements at NIST today focus on graphene as a next generation of quantum resistance standard, the measurement needs of U. S. industry, and new demands for resistance measurements and standards in applications ranging from low-current sensing technologies to high current needs in the delivery of electric power. The historical past will be reviewed and the present status presented with an outlook towards the future of the NIST Quantum Ohm.

Presenter: Dean Jarrett

Affiliation: National Institute of Standards and Technology

Address: 100 Bureau Drive, Stop 8171, Gaithersburg, MD, 20899

Telephone: 301-975-4240

Email: dean.jarrett@nist.gov

Dean G Garrett - MSCDean G. Jarrett was born in Baltimore, MD, in 1967. He received the B.S. degree in electrical engineering from the University of Maryland, College Park, in 1990 and the M.S. degrees in electrical engineering and applied biomedical engineering from Johns Hopkins University, Baltimore, in 1995 and 2008, respectively.

Since 1986, he has been with the National Institute of Standards and Technology (NIST), in Gaithersburg, MD, where he was a Cooperative Education Student from the University of Maryland. During this time, he worked in the DC resistance area on the automation of resistance calibration systems. In 1991 he joined NIST full time as an electrical engineer working on the development of an automated AC resistance calibration system and the development of new resistance standards.

Since 1994, he has worked in the high resistance laboratory developing automated measurement systems and improved standard resistors to support high resistance calibration services and key comparisons. In recent years, he has worked on sensor technologies for the detection of biological molecules and low-current source and measure techniques.  Since 2014, he has led the Metrology of the Ohm Project at NIST.


Title: The Anatomy of Measurement

Friday, March 27, 2020 (After Lunch)

Abstract: This presentation will cover the measurement process in its entirety.  Discussions will include traceability, measurement steps, quality control procedures and ideologies and what results are given to the customer.  The discussion will use a microwave power standard measurement as an example.

Presenter: Ron Ginley

Affiliation: Retired, National Institute of Standards and Technology

Email: rginley@ieee.org

Ron Ginley - MSCRon Ginley is recently retired after being employed by The National Institute of Standards and Technology (NIST) for the past 37 years, all in the microwave area.  At NIST Ron had several areas of responsibility.  He was responsible for the metrology research in the microwave scattering-parameter and power areas and led the microwave measurement services which included the microwave s-parameter, thermal noise and power measurement services.  Ron continues to act as a consultant for NIST.

Ron is an active participant and contributor to the IMS, MSC, NCSL-I and ARFTG conferences.  He has participated in all of these organizations since the mid 1980’s presenting papers and serves on several standards and working committees.  Ron currently is the Treasurer and Executive Committee member of the Automatic Radio Frequency Techniques Group (ARFTG), a professional group dedicated to microwave/mm-wave measurements and is a member of the IEEE Microwave Theory and Techniques Society’s Advisory Committee.  Ron will be chairing the 2022 International Microwave Symposium and has chaired many ARFTG Symposium as well as the 2018 Global Symposium on Millimeter Waves.