Technical Sessions: Hands-On Demonstration and Practical Applications


1A & 2A: THE VULNERABILITY OF METROLOGY M&TE WITH RELATION TO CYBERSECURITY COMPLIANCE: Pt.1 & Pt.2

CLASS: 1.5 HOURS EACH

PART 1 – Thursday, March 28th: 8:30am – 10:00am

PART 2 – Thursday, March 28th: 10:45am – 12:15pm

Speaker: Suren Hazarian, Navy Surface Warfare Center

Abstract

ABSTRACT:

In recent years, the integration of digital technologies in metrology has revolutionized the field of measurements, providing increased accuracy and efficiency. However, this integration has also increased the vulnerability of metrology measurement equipment to cyber attacks, which can result in inaccuracies in measurements, data breaches, and disruptions in data transmission. Effective cybersecurity controls are essential to ensure the protection of these systems from unauthorized access, tampering, and other cyber threats. This presentation will examine the implications of cybersecurity controls for metrology measurement equipment, including the importance of implementing strong passwords, regularly updating software and firmware, and using secure communication protocols. Additionally, the presentation will discuss the role of cybersecurity in ensuring the integrity and reliability of measurement data, and the importance of compliance with industry standards and regulations) 

Instructor Biography

Speaker:

Mr. Suren HazarianMr. Suren Hazarian currently serves as the Business Manager for the Engagement Systems Division in the Performance Assessment Department at Naval Surface Warfare Center Corona Division.  Additionally, he is an adjunct faculty member at Pepperdine University’s Graziadio School of Business in the Information Systems and Decisions Sciences departmentMr. Hazarian’s breadth of experience comprises an 18 year career with the US Navy working in different capacities on projects that include ChemBio detection systems analysis, counter IED electronic warfare, cyber security compliance and risk frameworks, and missile telemetry data collection.   


1B: NDT QUALITY TESTING

CLASS: 1.5 HOURS 

Thursday, March 28th: 8:30am – 10:00am

Speaker: Mark Lindsey

Abstract

ABSTRACT:

 

Instructor Biography

Speaker:

 

 

 


1C: METROLOGY SOFTWARE

CLASS: 1.5 HOURS 

Thursday, March 28th: 8:30am – 10:00am

Speaker: Michael Schwartz

Abstract

ABSTRACT:

As we move into the interconnected world of the digital age metrology software will have to keep pace.  Technologies will have to be evaluated, examined, and understood in order to build systems that work under the FAIR principles enabling the industry to easily exchange complex measurement data.  This talk will cover the concepts of Model Driven Software Engineering and its applications for metrology as well as the emerging concept of a Metrology Taxonomy.  

Instructor Biography

Speaker:

Michael SchwartzMr. Schwartz completed training at Lowry AFB in 1989 and was honorably discharged after 11 years of service in the US Army. While in the Army, he attended the University of Maryland Global Campus and graduated with a Bachler’s degree in Business Management with a minor in Computer Science.  

After leaving the military, he spent five years as Intercal’s lead developer writing automated calibration procedures in Fluke MET/CAL®. There he created an innovative object-oriented approach for building MET/CAL procedures supporting flexible standards.  

He went on to found Cal Lab Solutions in 2003, where he created the world’s largest library of MET/CAL® procedures and build automation in various other technologies. In 2015, Cal Lab Solutions released the beta version of Metrology.NET®. Now a mature product, Metrology.NET has proven to be a next generation concept of metrology software built for the digital age.  

Currently he is serving to create & define digital metrology standards by presenting papers, creating training tutorials, and/or participating in panel discussions on the topic at MSC, NCSLI, CIM, MSA, MetroInd, and other professional organizations.  

 

 

 


1D: MICROWAVE AND RF: GOOD MEASUREMENT PRACTICES FOR CALIBRATION LABORATORIES

CLASS: 1.5 HOURS 

Thursday, March 28th: 8:30am – 10:00am

Speaker: Brian (Yeou Song) Lee

Abstract

ABSTRACT:

This session covers the essential measurement practices and integrity of your microwave & RF measurements, which would ensure the validity of results and estimates of measurement uncertainty. The topics include power sensors (one port), attenuators (two ports), and splitters (3 ports). The missing links of your vector network analyzer and applications are discussed, which are important to your estimate of uncertainty. Tools for dealing with these topics are presented.   

Instructor Biography

Speaker:

Brian (Yeou Song) Lee

  • Experienced in electrical calibration and testing from DC to Microwave Frequency 
  • Competent in EMI/EMC, measurement technique and uncertainty analysis for wireless communication figure of merits (EVM, BER, etc.); IEEE Working Committee Members on Digital Modulation Measurement, Lidar, and Large Signal Instrumentation. IEEE 287 and P1770, IEEE P1765, JEDEC/SEMATECH/AEC testing standards and technologies 
  • Mentor in business process management and discipline such as Lean Six Sigma, Gemba Kaizen, Taguchi method, Design of Experiment, Reliability Engineering, Statistical Process Control, Quality Management System (TQA / TQC / TQM), Theory of Constraint for Production, Toyota Production System (TPC), HALT/HASS, TRIZ (Systematic Innovation Technique), Zero Defects 
  • Proficient in regulatory compliance and quality management: FCC, FDA 510k/PMA, FDA Medical Electric Safety, AS9100, ISO 17065, ISO 17025, ISO 17043, ISO 13485, China ROHS, EU NIST RED NB 
  • Familiar with product development, manufacturing/testing process and services 
  • Software: Python, R Statistics, SQL database, LabView, MATLAB, OCTAVE, MATHCAD, NIST MUF, METAS VNA Tools II, Minitab 16/17
  • Quality Manager-iTest July 2023 to Present 

 


2B: THE HIDDEN VALUE OF FDA 21 CFR PART 11  – ELECTRONIC RECORDS AND ELECTRONIC SIGNATURES 

CLASS: 1.5 HOURS

Thursday, March 28th: 10:45am – 12:15pm

Speaker: Walter Nowocin, IndySoft

Abstract

ABSTRACT:

There are many regulatory requirements that bio-medical companies need to follow; however, FDA 21 CFR Part 11 – Electronic Records; Electronic Signatures is one of the more obscure and misunderstood of the compliance regulations. In this presentation, we will review the background and content of FDA 21 CFR Part 11. We will highlight the three most important aspects of the document, discuss the three core aspects, and then reveal the hidden value of FDA 21 CFR Part 11 for computer software applications. 

Instructor Biography

Speaker:

Walter Nowocin - MSCWalter Nowocin is the Life Sciences Product Manager for IndySoft Corporation. Walter works with development, marketing, and sales to ensure that IndySoft is optimized to support calibration quality systems in regulated industries while being compliant with FDA, GMP, and ISO requirements. Walter has over 35 years of calibration experience with Medtronic, the world’s largest medical device manufacturer, as a Calibration Department Senior Engineering Manager and with the United States Marine Corps as a Precision Measurement Equipment Master Sergeant. Walter is Co-Chair of the NCSL International Healthcare Metrology Committee and is the Coordinator of the NCSLI Minnesota Section. Walter is the recipient of the 2023 NCSLI Education and Training Award and is a Co-Author of the Third Edition of the ASQ Metrology Handbook. Walter has a Masters in Engineering Management degree from St. Cloud State University, Minnesota and is a Fellow of the American Society of Engineering Management. 


2C: DRY BLOCK CALIBRATOR

CLASS WITH HANDS-ON COMPONENTS: 1.5 HOURS 

Thursday, March 28th: 10:45am – 12:15pm

Speaker: Scott A. Crone 

Abstract

ABSTRACT:

This course is an introduction to the design, construction, evolution, practical use, and common errors associated with dry block temperature calibrators. The course will start by examining known temperature calibration devices including their benefits and limitations. It will progress to discuss dry block calibrator design, evolution, and progression to the current level of temperature standard. The material will include dry block selection, use, best practices, set up, care, misuses, and common issues experienced while using dry block calibrators. The course will finish with hands-on activities with various levels of dry block calibrators. 

Instructor Biography

Speaker:

Scott A. CroneI am in my 30th year with AMETEK and prior to that was an Electronics Technician, Nuclear with the US Navy. My responsibilities while serving included maintenance and calibration of the nuclear plant instrumentation as well as operation of the reactor plant itself. In addition to my rate, I was also an instructor at two of my duty station schools and was awarded Master Training Specialist by the Chief of Naval Technical Training. In my 29 years with AMETEK, I have held positions of increasing responsibility that have included sales, marketing, and product management. Within those roles, I have conducted hundreds of hours of training. While with AMETEK, I graduated from Eckerd College with dual major BA in management. I have provided instruction at previous NCSLI and ISA events as well as many technical and operators events and have had papers and articles published. I am currently a member of the NCSLI, ISA, SME (professional), and ISPE. I am active with my homeowners’ association board of directors and am chairman and founder of the Largo Spurs Tottenham Hostpur Official Supporters’ Club. 

 


2D: PROFICIENCY TESTING: DEFINING EXPECTATIONS, ROLES, AND RISKS FOR ALL INVOLVED

CLASS: 1.5 HOURS 

Thursday, March 28th: 10:45pm – 12:15pm

Speaker: Chuck Ellis

Abstract

ABSTRACT:

TBD

Instructor Biography

Speaker:

Annual Measurement Science Conference - MSC

Chuck Ellis

 


3A: PROBABILITY OF FALSE ACCEPTANCE ESTIMATION FOR ASYMMETRICAL TOLERANCES

HANDS-ON: 45 MINUTES

Thursday, March 28th: 1:45pm – 2:30pm

Speaker: Norma Vasquez 

Abstract

ABSTRACT:

https://www.callabmag.com/wp-content/uploads/2019/07/apr19_web-1.pdf#page=26 

  1. Introduction 
  1. Developing a PFA Estimation Equation for Asymmetric Limits 
  1. Example of Application 
  1. Conclusion 
  1. References 
  1. Hands On – Calibration sample and datasheet application.  

Instructor Biography

Speaker:

TBD

 


3B: HOW TO GET THE MOST VALUE FROM YOUR MULTI-PRODUCT CALIBRATOR

CLASS WITH HANDS-ON COMPONENTS: 45 MINUTES  (BRING A METER)

Thursday, March 28th: 1:45pm – 2:30pm

Speaker: Marty Kidd

Abstract

ABSTRACT:

Presenter will cover what workload can be tested/calibrated using a multi-product calibrator, including tips and methodology.   

Hands on session will include testing several types of test equipment.  Attendees are encouraged to bring their Own handheld DMM or clamp meter that they will have the opportunity to test during the hands on session. 

Instructor Biography

Speaker:

Marty Kidd - MSCMarty Kidd got his start in metrology in the USAF in Jan 1983 as a PMEL technician. Ater almost 10 years he left the Air Force during it’s draw down phase and worked at a small third party calibration lab in Redmond, WA for a yearMarty joined Fluke in Jan 1994 as a metrology technician working in their Everett Service labHe spent 12 years total in the service lab including 4 years as Lab supervisor and the final 4 years as Service Center managerHe then moved into the Manufacturing Manager Role for the Fluke Calibration Electrical calibrator and standards group for 5 yearsMarty has spent the last 13 years at Fluke in Technical sales for Electrical Calibration.  

 


3C: DEADWEIGHT PRESSURE TESTER FUNDAMENTALS

CLASS WITH HANDS-ON COMPONENTS: 45 MINUTES

Thursday, March 28th: 1:45pm – 2:30pm

Speaker: Scott A. Crone 

Abstract

ABSTRACT:

This course is an introduction to the design, construction, theory of operation, practical use, and common errors associated with deadweight pressure testers. The course will start by explaining the theory of operation of deadweight pressure testers. It will include details on piston gauges and ball type testers. The material will include deadweight tester use, best practices, set up, care, misuses, and common issues experienced while using deadweight testers including a section on site corrections with examples. The course will finish with hands-on activities with a deadweight pressure tester. 

Instructor Biography

Speaker:

Scott A. CroneI am in my 30th year with AMETEK and prior to that was an Electronics Technician, Nuclear with the US Navy. My responsibilities while serving included maintenance and calibration of the nuclear plant instrumentation as well as operation of the reactor plant itself. In addition to my rate, I was also an instructor at two of my duty station schools and was awarded Master Training Specialist by the Chief of Naval Technical Training. In my 29 years with AMETEK, I have held positions of increasing responsibility that have included sales, marketing, and product management. Within those roles, I have conducted hundreds of hours of training. While with AMETEK, I graduated from Eckerd College with dual major BA in management. I have provided instruction at previous NCSLI and ISA events as well as many technical and operators events and have had papers and articles published. I am currently a member of the NCSLI, ISA, SME (professional), and ISPE. I am active with my homeowners’ association board of directors and am chairman and founder of the Largo Spurs Tottenham Hostpur Official Supporters’ Club. 

 


3D: THE IMPORTANCE OF DYNAMIC CALIBRATION OF PASSIVE I-V CURVE TRACERS

CLASS: 45 MINUTES 

Thursday, March 28th: 1:45pm – 2:30pm

Speaker: Alexander Cimaroli

Abstract

ABSTRACT:

Photovoltaic I-V curve tracers are commonly used to quantitatively assess the performance of solar modules deployed in the field. Despite their popularity, methods of adequately calibrating field-capable, high-power I-V curve tracers are not well established. Many manufacturers calibrate I-V curve tracers by static means only. Data has been collected with a well-known I-V curve tracer that shows a significant difference in accuracy between static and dynamic measurements. A clear trend is seen where the errors in measurement grow with increasing rates of change in voltage and current. 

Instructor Biography

Speaker:

Alexander Cimaroli | MSCAlexander Cimaroli

B.S. Physics from Purdue University, IN 

Ph.D. Physics from University of Toledo, OH 

Non-contact temperature and solar metrologist for Fluke for 4 years 

 

 


4A: EXPLORING TEMPERATURE CALIBRATION EFFICIENCY: A COMPARATIVE STUDY OF SMALL VS. FULL-SIZED TRIPLE POINT OF WATER CELLS AND DETERMINING OPTIMAL SYSTEM COMPATABILITY

CLASS: 1.5 HOURS 

Thursday, March 28th: 3:15pm – 4:45pm

Speaker: Kurt Zabriskie

Abstract

ABSTRACT:

This tutorial presents an in-depth comparative analysis between smaller and full-sized triple point of water (TPW) cells, aiming to reveal valuable insights into their effectiveness in calibration processes. By leveraging real-world data, the tutorial scrutinizes the performance of small TPW cells while assessing the consistency of testing outcomes across both cell sizes. Furthermore, it delves into the necessity of TPW cells through illustrative real-world examples, elucidating the circumstances where they are indispensable and the types of systems that are most suitable. Through a methodical approach, this tutorial provides a comprehensive exploration of the benefits, constraints, and practical implications associated with the utilization of smaller TPW cells in calibration procedures. Ultimately, it equips researchers and practitioners in the field of metrology and precision measurement with the knowledge necessary for informed decision-making. 

Instructor Biography

Speaker:

Jon Sanders | MSC Jon Sanders is the President of Additel Corporation headquartered in Brea, CA, USA. Jon has a bachelor’s degree from Brigham Young University, and a Master’s in Business Administration from the University of Utah. Jon worked for Fluke Corporation from 2001 to 2013. At Fluke, Jon was involved in several roles including sales, marketing, logistics and product management. Jon came to Additel in 2013 as the VP of Marketing and during his time at Additel has made a major contribution to the company. Jon has been a key member of the management team and has been instrumental in growing the business in his responsibilities with Additel. 

 

 


4B: UTILIZING DIGITAL EQUIPMENT SPECIFICATIONS TO HELP AUTOMATE THE MEASUREMENT UNCERTAINTY BUDGETING PROCESS

CLASS: 1.5 HOURS 

Thursday, March 28th: 3:15pm – 4:45pm

Speaker: Curt Casto

Abstract

ABSTRACT:

This session will discuss and demonstrate storing equipment specifications in componentized form within an XML file or SQL Server database. These electronic form specifications can then be automatically or manually assigned as calibration standards to calibration test points. This specification data is then used to automatically calculate standards accuracies for measurement test points. The standards accuracy data is also used to automatically create uncertainty budget items with calculated error limits and uncertainty. The session will further discuss and demonstrate key principles in linking calibration standard electronic specifications to measurement test points, passing parametric data for use in specification equations, and automatic units of measure conversion. 

Other topics covered will include: 

  • Other uses for electronic specifications. 
  • Using the linkages between the electronic specification-based calibrations standards and calibration test points to perform calibration test point level reverse traceability. This type of reverse tracing utilizes the linking relationship between a specific function/range of a calibration standard and a data sheet test point. 
  • Other uncertainty modeling and calibration data analysis functionality is made possible via the data linking system. 

The presentation is focused on the techniques employed, not a specific product. However, the techniques will be demonstrated using the MOX Metrology Process Studio software. 

Intended Audience: 

Metrology Engineers 

Metrologists 

Software Developers 

Quality Managers 

Instructor Biography

Speaker:

Curt Casto | MSCCurt Casto has more than forty years’ experience in metrology and thirty-five years’ experience developing metrology software. He has designed and developed many metrology automation and data analysis applications. Curt has also designed and developed two comprehensive metrology applications that make broad use of the techniques presented in this session. These are the MOX Metrology Process Studio for American Technical Services and the MudCats Calibration Process Manager for Southern California Edison.

 

 


4C: APPLYING IoT TECHNOLOGIES IN A CALIBRATION LABORATORY SETTING TO IMPROVE EFFICIENCY AND REDUCE COSTS

CLASS: 1.5 HOURS 

Thursday, March 28th: 3:15pm – 4:45pm

Speaker: Mitchell Jones

Abstract

ABSTRACT:

Learning Session on IoT Technologies from Global Asset Tracking, Digital Calibration Stickers/Tags, Active and Passive RFID Solutions, Automated Tool Locker Cabinets and more which can help both internal and external commercial laboratories improve operational efficiency and compliance readiness.  

IoT Technologies have several benefits and when successfully implemented can help calibration labs and asset owners in a variety of ways such as: 

  1. Reduction in costs of tool ownership 
  1. Improved tool visibility across multiple locations 
  1. Reduction in lost/missing assets  
  1. Enhanced return on capital 
  1. Improved productivity and operation efficiency   

Instructor Biography

Speaker:

Mitchell Jones | MSCMitchell is a proud US Navy veteran who serves as the Director of Sales & Business Development for IndySoft, a leader in the calibration management software industry. Mitchell also serves on the Board of Directors for the National Association for Proficiency Testing. Mitchell is a passionate lifelong learner and a technology advocate. While not serving in the metrology community, Mitchell enjoys the occasional round of golf and spending time with his wife and two children.