NIST Seminars

APRIL 16, 2019 – TUESDAY

WORKSHOP		TITLE		PRESENTER		DURATION
N01		JCGM Guide to the Expression of Uncertainty in Measurement		William Guthrie and Hung-Kung Liu		April 16-18, Tues-Thurs (3 Day)
N02		NIST Pressure and Vacuum Measurement		Jacob Ricker and Christopher Meyer, NIST Thermodynamic Metrology Group		April 16-17, Tues-Wed (2 Day)
N03		Understanding ISO/IEC 17025:2017		Dana Leaman		April 16, Tuesday (1 Day)
N04		Microwave Measurement Fundamentals		Ron Ginley, NIST RF Electronics Group, RF Technology Division		April 16, Tuesday (1 Day)
N05		Realization and Dissemination of Mass in the “New SI”		Patrick Abbott		April 16, Tuesday (1 Day)

APRIL 17, 2019 – WEDNESDAY

WORKSHOP		TITLE		PRESENTER		DURATION
N06		Auditing, Traceability, and Auditing of Traceability: auditing to ISO/IEC 17025:2017		Kari Harper and Titilayo Shodiya NVLAP		April 17, Wednesday (1 Day)
N07		Traceability, Operations, and Good Measurement Practices for Balances in an Analytical Environment		Mark Ruefenacht, NIST OWM, Rice Lake Weighing Systems		April 17, Wednesday (1 Day) Canceled
N08		Introduction to Photonics		Zeeshan Ahmed,NIST, Sensor Science Division, Thermodynamic Metrology Group		April 17, Wednesday (1 Day)
N10		Fundamentals of Metrology		Georgia Harris and Carol Hockert		April 17-18, Wed – Thurs (2 Day)

APRIL 18, 2019 – THURSDAY

WORKSHOP		TITLE		PRESENTER		DURATION
N09		Optical Gas Pressure Measurement via Fixed Length Optical Cavity (FLOC) Pressure Standards		Jacob Ricker, NIST Thermodynamic Metrology Group		April 18, Thursday (1 Day)
N10		Fundamentals of Metrology		Georgia Harris and Carol Hockert		April 17-18, Wed – Thurs (2 Day)

For any questions contact MSC Committee 1-866-672-6327 measurementscienceconference@gmail.com